| Поле DC | Значение | Язык |
|---|
| dc.contributor.author | Berdnichenko, A. V. | - |
| dc.contributor.author | Goponov, Yu. A. | - |
| dc.contributor.author | Shatokhin, R. A. | - |
| dc.contributor.author | Takabayashi, Y. | - |
| dc.contributor.author | Vnukov, I. E. | - |
| dc.date.accessioned | 2022-10-19T16:39:59Z | - |
| dc.date.available | 2022-10-19T16:39:59Z | - |
| dc.date.issued | 2022 | - |
| dc.identifier.citation | A proof-of-principle experiment on a new diagnostic tool for determining beam sizes from angular distributions of parametric X-ray radiation / A.V. Berdnichenko [et al.] // Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. - 2022. - Vol.1032.-Art. 166619. - Doi: 10.1016/j.nima.2022.166619. - URL: https://www.sciencedirect.com/science/article/pii/S0168900222001930 | ru |
| dc.identifier.uri | http://dspace.bsu.edu.ru/handle/123456789/48121 | - |
| dc.description.abstract | A previously proposed technique for measuring the transverse sizes of an electron beam was verified experimentally by comparing the angular distributions of parametric X-ray radiation in a thin crystal for two distances between the crystal and the detector. The measurements were performed on a 255-MeV electron beam incident on a 20 μm-thick silicon crystal | ru |
| dc.language.iso | en | ru |
| dc.subject | physics | ru |
| dc.subject | optics | ru |
| dc.subject | parametric X-ray radiation | ru |
| dc.subject | transverse beam sizes | ru |
| dc.subject | silicon crystal | ru |
| dc.subject | imaging plate | ru |
| dc.title | A proof-of-principle experiment on a new diagnostic tool for determining beam sizes from angular distributions of parametric X-ray radiation | ru |
| dc.type | Article | ru |
| Располагается в коллекциях: | Статьи из периодических изданий и сборников (на иностранных языках) = Articles from periodicals and collections (in foreign languages)
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