| Поле DC | Значение | Язык |
|---|
| dc.contributor.author | Zakhvalinskii, V. S. | - |
| dc.contributor.author | Golev, I. M. | - |
| dc.contributor.author | Borisenko, L. V. | - |
| dc.contributor.author | Khmara, A. N. | - |
| dc.contributor.author | Piljuk, E. A. | - |
| dc.contributor.author | Kolesnikov, D. A. | - |
| dc.date.accessioned | 2020-01-29T11:54:37Z | - |
| dc.date.available | 2020-01-29T11:54:37Z | - |
| dc.date.issued | 2016 | - |
| dc.identifier.citation | Morphology and properties of ZnO films obtained by repeated spin coating on porous silicon substrates / V.S. Zakhvalinskii [и др.] // Bulletin of the Russian Academy of Sciences: Physics. - 2016. - Vol.80, №9.-P. 1115-1118. | ru |
| dc.identifier.uri | http://dspace.bsu.edu.ru/handle/123456789/28231 | - |
| dc.description.abstract | Layers of porous silicon (PS), multilayered ZnO films, and heterostructures based on them are obtained. The surface morphology, chemical and phase composition of the PS layers and ZnO films, and the transverse cleavage of ZnO-PS nanocomposite, are investigated via energy-dispersive X-ray spectral analysis (EDX), X-ray diffraction (XRD), and scanning electron microscopy (SEM) | ru |
| dc.language.iso | en | ru |
| dc.subject | physics | ru |
| dc.subject | solid state physics | ru |
| dc.subject | thin films | ru |
| dc.subject | multilayered films | ru |
| dc.subject | porous silicon | ru |
| dc.subject | nanocomposites | ru |
| dc.subject | properties | ru |
| dc.subject | morphology | ru |
| dc.subject | energy-dispersive X-ray spectral analysis | ru |
| dc.subject | X-ray diffraction | ru |
| dc.subject | scanning electron microscopy | ru |
| dc.title | Morphology and properties of ZnO films obtained by repeated spin coating on porous silicon substrates | ru |
| dc.type | Article | ru |
| Располагается в коллекциях: | Статьи из периодических изданий и сборников (на иностранных языках) = Articles from periodicals and collections (in foreign languages)
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